Details, datasheet, quote on part number: ADS5440
PartADS5440
CategorySemiconductors => Data Converters => Analog-to-Digital Converters (ADCs) => High Speed ADCs (>10MSPS)
Part familyADS5440 13-Bit, 210-MSPS Analog-to-Digital Converter (ADC)
Description13-Bit, 210-MSPS Analog-to-Digital Converter (ADC) 80-HTQFP -40 to 85
CompanyTexas Instruments, Inc.
StatusACTIVE
ROHSY
SampleNo
DatasheetDownload ADS5440 datasheet
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Specifications 
Operating Temperature Range(C)-40 to 85
SNR(dB)69
Analog Input BW(MHz)500
# Input Channels1
RatingCatalog
Power Consumption(Typ)(mW)2250
InterfaceParallel LVDS
Resolution(Bits)13
SFDR(dB)80
DNL(Max)(+/-LSB)0.4
Approx. Price (US$)59.75 | 1ku
INL(Max)(+/-LSB)0.9
ENOB(Bits)11.4
Input Range(Vp-p)2.2
Package GroupHTQFP
DNL(Typ)(+/-LSB)0.4
ArchitecturePipeline
Reference ModeInt
INL(Typ)(+/-LSB)0.9
SINAD(dB)68
Sample Rate(Max)(MSPS)210
Input BufferYes
  Mecanical Data
Pin nbPackage typeInd stdJEDEC codePackage qtyCarrierDevice markWidth (mm)Length (mm)Thick (mm)Pitch (mm)
80PFPHTQFPS-PQFP-G96JEDEC TRAY (10+1)ADS5440IPFP 12121.5
Application notes
• Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passiv | Doc
• Why Use Oversampling when Undersampling Can Do the Job? (Rev. A) | Doc
• CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed, high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483, which is capable of sampling up to 135 MSPS. To realize the full potential o | Doc
• Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A) | Doc
• Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock, VCXO clock, and the CDCE72010 itself. This | Doc
• High-Speed, Analog-to-Digital Converter Basics
The goal of this document is to introduce a wide range of theories and topics that are relevant tohigh-speed, analog-to-digital converters (ADC). This document provides details on sampling theory,data-sheet specifications, ADC selection criteria and evalua | Doc
• Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for | Doc
Evaluation Kits
ADS5463EVM: ADS5463 12-Bit, 500-MSPS Analog-to-Digital Converter Evaluation Module
ADS5474EVM: ADS5474 14-Bit, 400-MSPS Analog-to-Digital Converter Evaluation Module
TSW2200EVM: TSW2200 Low-Cost Portable Power Supply Evaluation Module

 

Features, Applications

FEATURES

13-Bit Resolution 210 MSPS Sample Rate SNR = 69.1 dBc 100-MHz IF and 210 MSPS SFDR = 81 dBc 100-MHz IF and 210 MSPS SNR = 68.1 dBc 230-MHz IF and 210 MSPS SFDR = 79 dBc 230-MHz IF and 210 MSPS 2.2 VPP Differential Input Voltage Fully Buffered Analog Inputs 5 V Analog Supply Voltage 3.3 V LVDS Compatible Outputs Total Power Dissipation: W 2's Complement Output Format TQFP-80 PowerPADTM package Industrial Temperature Range to 85C

APPLICATIONS

Test and Measurement Software-Defined Radio Multi-channel Basestation Receivers Basestation TX Digital Predistortion Communication Instrumentation

DESCRIPTION

The 13-bit 210 MSPS analog-to-digital converter (ADC) that operates from 5 V supply, while providing LVDS-compatible digital outputs from 3.3 V supply. The ADS5440 input buffer isolates the internal switching of the onboard track and hold (T&H) from disturbing the signal source. An internal reference generator is also provided to further simplify the system design. The ADS5440 has outstanding low noise and linearity over input frequency.

The ADS5440 is available an 80-pin TQFP PowerPADTM package. The ADS5440 is built on state of the art Texas Instruments complementary bipolar process (BiCom3X) and is specified over the full industrial temperature range to 85C).

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PowerPAD is a trademark of Texas Instruments.

PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice.

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGING/ORDERING INFORMATION (1)

Transport Media, Quantity Tray, 96 Tape and Reel, 1000

For the most current product and ordering information, see the Package Option Addendum located at the end of this data sheet. Thermal pad size: 7,5 mm (typ)

over operating free-air temperature range (unless otherwise noted) (1)

VALUE / UNIT Supply voltage Analog input to GND Clock input to GND CLK to CLK Digital data output to GND Operating temperature range Maximum junction temperature Storage temperature range (1) AVDD to GND DRVDD to GND to 150C

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only and functional operation of the device at these or any other conditions beyond those specified is not implied.

PARAMETER Soldered slug, no airflow JA Soldered slug, 250-LFPM airflow Unsoldered slug, no airflow Unsoldered slug, 250-LFPM airflow JC (1) Bottom of package (heatslug) TEST CONDITIONS TYP UNIT C/W

Using 36 thermal vias x 6 array). See the Application Section.

MIN SUPPLIES AVDD DRVDD Analog supply voltage Output driver supply voltage Differential input range VCM 1/tC Input common mode ADCLK input sample rate (sine wave) Clock amplitude, differential sine wave Clock duty cycle TA Open free air temperature C CLOCK INPUT 210 MSPS Vpp V VPP V NOM MAX UNIT

MIN, TYP, and MAX values = 25C, full temperature range is TMIN 40C to TMAX = 85C, sampling rate = 210 MSPS, 50% clock duty cycle, AVDD 5 V, DRVDD V, 1 dBFS differential input, and 3 VPP differential clock, unless otherwise noted

PARAMETER Resolution ANALOG INPUTS Differential input range Differential input resistance (DC) Differential input capacitance Analog input bandwidth INTERNAL REFERENCE VOLTAGE VREF Reference voltage No missing codes DNL INL Differential linearity error Integral linearity error Offset error Offset temperature coefficient Gain error Gain temperature coefficient PSRR POWER SUPPLY IAVDD IDRVDD Analog supply current Output buffer supply current Power dissipation Power-up time DYNAMIC AC CHARACTERISTICS fIN = 10 MHz fIN = 70 MHz fIN = 100 MHz SNR Signal-to-noise ratio fIN = 170 MHz fIN = 230 MHz fIN = 300 MHz fIN = 400 MHz dBc VIN = full scale, fIN = 70 MHz, = 210 MSPS 5 5 fIN = 10 MHz fIN = 10 MHz 5 2.4 Tested 1.5 5 LSB mV mV/C %FS %/C mV/V V DYNAMIC ACCURACY Vpp k pF MHz TEST CONDITIONS MIN TYP 13 MAX UNIT Bits


 

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