|Category||Semiconductors => Logic => Flip-Flop/Latch/Register => Shift Register|
|Part family||SN74ALS299 8-Bit Universal Shift/Storage Registers With 3-State Outputs|
|Description||8-Bit Universal Shift/Storage Registers With 3-State Outputs 20-SOIC 0 to 70|
|Company||Texas Instruments, Inc.|
|Datasheet||Download SN74ALS299 datasheet
|Cross ref.||Similar parts: SN74LS299J, SN74LS299JB, SN74LS299JT, SN74LS299JTB, SN74LS299N, SN74LS299NB, SN74LS299NT, SN74LS299NTB, SN74LS323J, SN74LS323N|
|Operating Temperature Range(C)||0 to 70|
|tpd @ Nom Voltage(Max)(ns)||19|
|Output Drive (IOL/IOH)(Max)(mA)||24/-2.6|
|Approx. Price (US$)||2.71 | 1ku|
|F @ Nom Voltage(Max)(Mhz)||75|
|ICC @ Nom Voltage(Max)(mA)||40|
|Pin nb||Package type||Ind std||JEDEC code||Package qty||Carrier||Device mark||Width (mm)||Length (mm)||Thick (mm)||Pitch (mm)|
|• Advanced Schottky (ALS and AS) Logic Families
This document introduces the advanced Schottky family of clamped TTL integrated circuits (ICs). Detailed electrical characteristics of the 'AS and 'ALS devices with table formats are provided. Guidelines for designing high-performance digital systems using | Doc
Multiplexed I/O Ports Provide Improved Bit Density Four Modes of Operation: Hold (Store) Shift Right Shift Left Load Data Operate With Outputs Enabled or at High Impedance 3-State Outputs Drive Bus Lines Directly Can Be Cascaded for n-Bit Word Lengths Direct Overriding Clear Applications: Stacked or Push-Down Registers Buffer Storage Accumulator Registers Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (N) and Ceramic (J) 300-mil DIPsdescription
These 8-bit universal shift /storage registers feature multiplexed I/O ports to achieve full 8-bit data handling in a single 20-pin package. Two function-select (S0, S1) inputs and two outputenable (OE1, OE2) inputs can be used to choose the modes of operation listed in the function table.
Synchronous parallel loading is accomplished by taking both S0 and S1 high. This places the 3-state outputs in the high-impedance state and permits data applied on the I/O ports to be clocked into the register. Reading out of the register can be accomplished while the outputs are enabled in any mode. Clearing occurs asynchronously when the clear (CLR) input is low. Taking either or OE2 high disables the outputs, but has no effect on clearing, shifting, or storing data. The SN54ALS299 is characterized for operation over the full military temperature range to 125°C. The SN74ALS299 is characterized for operation from to 70°C.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
FUNCTION TABLE INPUTS MODE CLR OE1 OE2 CLK SL SR A/QA H L QBn a B/QB X QB0 QAn QCn b C/QC X QC0 QBn QDn c I/O PORTS D/QD X QD0 QCn QEn d E/QE X QE0 QDn QFn e F/QF X QF0 QEn QGn f G/QG X QG0 QFn QHn g H/QH X QH0 QGn L h OUTPUTS H L QBn QH0 QGn L hHold Shift Right Shift Left Load
NOTE: h = the level of the steady-state input at inputs A through H, respectively. This data is loaded into the flip-flops while the flip-flop outputs are isolated from the I/O terminals. When one or both output-enable inputs are high, the eight I/O terminals are disabled to the high-impedance state; however, sequential operation or clearing of the register is not affected.C/QC D/QD E/QE F/QF G/QG H/QH SL
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
18 11 Six Identical Channels Not Shown C1 SL (shift left serial input)
I/O ports not shown: B/QB (13), C/QC (6), D/QD (14), E/QE (5), F/QF (15), and G/QG (4).
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, VCC. 7 V Input voltage, VI: All inputs. 7 V I/O ports. 5.5 V Operating free-air temperature range, TA: to 70°C Storage temperature range. to 150°C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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