|Category||Semiconductors => Logic => Gate => NAND Gate|
|Part family||SN74ALS30A 8-input positive-NAND gates|
|Description||8-input positive-NAND gates 14-SOIC 0 to 70|
|Company||Texas Instruments, Inc.|
|Datasheet||Download SN74ALS30AD datasheet
|Cross ref.||Similar parts: DM74ALS30AM, DM74ALS30AMX|
|Pin nb||Package type||Ind std||JEDEC code||Package qty||Carrier||Device mark||Width (mm)||Length (mm)||Thick (mm)||Pitch (mm)|
|• Advanced Schottky (ALS and AS) Logic Families
This document introduces the advanced Schottky family of clamped TTL integrated circuits (ICs). Detailed electrical characteristics of the 'AS and 'ALS devices with table formats are provided. Guidelines for designing high-performance digital systems using | Doc
These devices contain an 8-input positive-NAND gate and perform the following Boolean functions in positive logic: H or Y=A+B+C+D+E+F+G+H
TA PDIP N PACKAGE Tube to 70°C SOIC D Tape and reel Tube Tape and reel SSOP DB CDIP to 125°C LCCC FK Tube Tape and reel Tube ORDERABLE PART NUMBER SNJ54ALS30AFK SNJ54AS30FK TOP-SIDE MARKING SNJ54AS30J SNJ54ALS30AFK
SNJ54AS30FK Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.FUNCTION TABLE INPUTS AH All inputs H One or more inputs L OUTPUT L H
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the D, DB, J, and N packages.absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC. 7 V Input voltage range, VI. 7 V Package thermal impedance, JA (see Note 1): D package. 86°C/W DB package. 96°C/W N package. 80°C/W Storage temperature range, Tstg. to 150°C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The package thermal impedance is calculated in accordance with JESD 51-7.
MIN VCC VIH VIL IOH Supply voltage High-level input voltage Low level input voltage Low-level High level output current High-level 'AS30 SN54ALS30A IOL Low-level output current SN54ALS30A TA Operating free free-air air temperature °C mA NOM 5 MAX 5.5 UNIT V mA
0 70 Applies to the 'AS30 and SN74ALS30A across the full operating temperature range, and SN54ALS30A over the temperature range to 70°C. Applies to the SN54ALS30A over the temperature range to 125°C.
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER VIK VOH VCC 5V V, VCC 5.5 55V TEST CONDITIONS 18 mA IOH 0.4 mA IOH 2 mA IOL 4 mA IOL 8 mA IOL 'AS30 SN54ALS30A IO¶ VCC SN74ALS30A 'AS30 ICCH ICCL 5V VCC 5.5 V, VCC mA V MIN TYP§ MAX 1.5 1.2 UNIT V
§ All typical values are at VCC 25°C. ¶ The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
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